About | APT&M2027

ABOUT.

Since 1952, the International Field Emission Society (IFES) has brought together the global community working at the frontiers of high field nanoscience and atom probe tomography. The Atom Probe Tomography and Microscopy (APT&M) 2027 conference continues this tradition, providing a biennial symposium for researchers from various disciplines (engineering, material science, geosciences, semiconductor, etc.) to share results and shape the future of the field.

Meeting topics

Fundamental Physics | Technique Development (sample preparation, cryogenic transfer, and automation) | Reconstruction, Data Analysis and Computational Methods | Nanoscale Materials Characterization (metals, oxides, semiconductors, minerals, biological, organics, liquids, etc.) | Correlative Workflows

Access the save the date flyer here

SAVE THE DATE - APT&M Canada 2027, June 6 - 11 2027, Banff, AB Canada. SCIENTIFIC TOPICS:
• Fundamentals and technique
development in APT
• Sample preparation, cryogenic
transfer, instrumentation,
and automation
• Data analysis, modeling,
simulation, and machinelearning-
enabled workflows
• Metals and alloys Electronic and
semiconductor materials
• Oxides, ceramics, and materials
for energy applications
• Soft, hybrid, and
biological systems
• Emerging materials and
new applications
• Correlative and multimodal
microscopy